Lock-In Thermography : Basics and Use for Functional Diagnostics of Electronic Components Author:  O. Breitenstein, M. Langenkamp Format:  Hardcover Publish Date:  November 2003 ISBN-10:  3540434399 ISBN-13:  9783540434399 List Price:  $169.00

For the best price: or just Pages: 193 Publisher: Springer Verlag Add this book to your wish list | View your wish list | Link to this book Click on this books subject categories to see related titles: Subjects : SCIENCE : Physics Subjects : SCIENCE : Weights & Measures Subjects : TECHNOLOGY : Electricity Subjects : Semiconductors - Thermal properties Subjects : TECHNOLOGY : Electronics / General : Electronic apparatus and appliances Subjects : TECHNOLOGY : Electronics / General : Electronic apparatus and appliances - Testing Subjects : Thermography Add your own review! Book Details Summary: The title of this book is Lock-In Thermography : Basics and Use for Functional Diagnostics of Electronic Components and it was written by O. Breitenstein, M. Langenkamp. This edition of Lock-In Thermography : Basics and Use for Functional Diagnostics of Electronic Components is in a Hardcover format. This books publish date is November 2003 and it has a suggested retail price of $169.00. There are 193 pages in the book and it was published by Springer Verlag. The 10 digit ISBN is 3540434399 and the 13 digit ISBN is 9783540434399.